Liquid Interface X-ray Scattering
Synchrotron x-ray surface scattering is the most powerful probe of molecular and mesoscale structure at liquid-vapor and liquid-liquid interfaces. The precise and flexible design of the liquid interface reflectometer at NSF’s ChemMatCARS (APS, 15-ID-C) and the high brilliance and wide x-ray energy range (5-70 keV) offered in this third generation insertion device beamline provides a world-leading capability for the study of liquid surfaces and buried liquid-liquid interfaces.
X-ray Reflectivity (XR)
Electron density profile normal to surfaces/interfaces.
Grazing Incidence X-ray Diffraction (GIXD)
In-plane ordering/disordering at the interfaces.
X-ray Off-specular Diffuse Scattering (XDS)
Interfacial height-height fluctuation and In-plane inhomogeneity.
Nonresonant Anomalous X-ray Reflectivity (NAXR)
Element-sensitive and valence-specific interfacial properties.
Resonant Anomalous X-ray Reflectivity (RAXR)
Element-sensitive and valence-specific interfacial properties.
X-ray Fluorescence Near Total Reflection (XFNTR)
Element-sensitive and valence-specific interfacial properties.
Grazing Incidence X-ray Off-specular Scattering (GIXOS)
Fast measurements for the kinetics of film thickness at the interfaces (min.).
Time-resolved Grazing Incidence X-Ray Diffraction (TRGIXD)
Follow time-evolution of in-plane structures (sec., min.).
Grazing Incidence Small Angle X-ray Scattering (GISAXS)
In-plane order on large length scales + disorder.
References/Additional Reading
- Liquid Surfaces and Interfaces: X-ray Synchrotron Methods (Peter S. Pershan and Mark L. Schlossman)
- Synchrotron X-Ray Scattering from Liquid Surfaces and Interfaces (Wei Bu and Mark L. Schlossman)
- Bu, Wei (2009) Thesis (PDF)
- Lectures of 2021 Data Analysis School on X-ray Scattering from Liquid Interfaces: PDF | Video
Liquid Interface Contact
Wei Bu
(630) 252-0470
weibu@uchicago.edu
Daniel Kerr
(630) 252-0486
danielhskerr@uchicago.edu
David Walwark
(630) 252-0486
walwark@uchicago.edu