Liquid Surface X-ray Scattering
Techniques
X-Ray Surface Sensitive Probes |
Interfacial Properties |
| X-ray Reflectivity (XR) | Electron density profile normal to surfaces/interfaces |
| Grazing Incidence X-ray Diffraction (GID) | In-plane ordering/disordering at the interfaces |
| Off-specular Diffuse Scattering | Interfacial height-height fluctuation and In-plane inhomogeneity |
| Anomalous X-ray Reflectivity | Element-sensitive and valence-specific interfacial properties |
| Resonant Anomalous X-ray Reflectivity | Element-sensitive and valence-specific interfacial properties |
| Fluorescence X-ray Scattering | Element-sensitive and valence-specific interfacial properties |
| Grazing Incidence X-ray Off-specular Scattering (GIXOS) | Fast measurements for the kinetics of film thickness at the interfaces (min.) |
| Time-dependent 2D GID | Follow time-evolution of in-plane structures (sec., min.) |
| Grazing Incidence Small Angle X-ray Scattering (GISAXS @20keV to 30keV) | In-plane order on large length scales + disorder |
Liquid Surface Contacts
Wei Bu
Beamline Scientist
(630) 252-0470
weibu@uchicago.edu
Liquid Surface/Interface Links
The following links provide further information regarding our liquid surface/interface x-ray scattering setup: