Liquid Surface X-ray Scattering: Techniques

 

X-Ray Surface Sensitive Probes

Interfacial Properties

X-ray Reflectivity (XR)

Electron density profile normal to surfaces/interfaces

Grazing Incidence X-ray Diffraction (GID)

In-plane ordering/disordering at the interfaces

Off-specular Diffuse Scattering

Interfacial height-height fluctuation and In-plane inhomogeneity

Anomalous X-ray Reflectivity

Element-sensitive and valence-specific interfacial properties

Resonant Anomalous X-ray Reflectivity

Element-sensitive and valence-specific interfacial properties

Fluorescence X-ray Scattering

Element-sensitive and valence-specific interfacial properties

Grazing Incidence X-ray Off-specular Scattering (GIXOS)

Fast measurements for the kinetics of film thickness at the interfaces (min.)

Time-dependent 2D GID

Follow time-evolution of in-plane structures (sec., min.)

Grazing Incidence Small Angle X-ray Scattering (GISAXS @20keV to 30keV)

In-plane order on large length scales + disorder

 

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