Liquid Surface X-ray Scattering: Reflectometer Specifications
15 ID-C Liquid Surface Scattering Reflectometer Specifications
Energy Range:
- 5keV – 70keV
Energy Accuracy (ΔE/E):
- ~10-4
Undulator Source Divergence (µrad)
- Horizontal: (2 σ´x) 23
- Vertical: (2 σ´y) 6 – 8
Undulator Source Size (µm)
- Horizontal: 2 σ´x 540
- Vertical: 2 σ´y 17
Sample table specification
- Load: 250Kg
- Travel (vertical direction): 400mm
- Precision: <±2µm
- Sample tabletop dimensions: 24in x 30in
Table For Typical Resolutions For Different Techniques At 15 ID-C
Parameters |
Resolution |
Comments |
Δk |
~±10-4k (Å-1) |
Determined by the Bruker monochromator |
Δα |
~±10-5 (rad) |
Determined by the incoming beam parameters |
Δβ |
~±10-5 (rad) |
For specular reflectivity, where reflected = incoming |
Δβ |
~±2*10-4 (rad) |
For off-specular using Pilatus area detector |
Δβ |
~±5*10-5 (rad) |
For off-specular using APEX-II area detector |
ΔθD |
~±2*10-4 (rad) |
In-plane diffraction using Pilatus area detector |
Contact
Yu-Sheng Chen
Advanced Crystallography
(630) 252-0471
yschen@cars.uchicago.edu
Mati Meron
Beamline Optics
(630) 252-0468
meron@cars.uchicago.edu
Wei Bu
Beamline Scientist
(630) 252-0470
bu@cars.uchicago.edu