Liquid Surface X-ray Scattering: Techniques

 

X-Ray Surface Sensitive Probes

Interfacial Properties

X-ray Reflectivity (XR) Electron density profile normal to surfaces/interfaces
Grazing Incidence X-ray Diffraction (GID) In-plane ordering/disordering at the interfaces
Off-specular Diffuse Scattering Interfacial height-height fluctuation and In-plane inhomogeneity
Anomalous X-ray Reflectivity Element-sensitive and valence-specific interfacial properties
Resonant Anomalous X-ray Reflectivity Element-sensitive and valence-specific interfacial properties
Fluorescence X-ray Scattering Element-sensitive and valence-specific interfacial properties
Grazing Incidence X-ray Off-specular Scattering (GIXOS) Fast measurements for the kinetics of film thickness at the interfaces (min.)
Time-dependent 2D GID Follow time-evolution of in-plane structures (sec., min.)
Grazing Incidence Small Angle X-ray Scattering (GISAXS @20keV to 30keV) In-plane order on large length scales + disorder